- Micron Technology, Inc. (Boise, ID)
- …of analytical instrumentation, including: + XPS (X-ray Photoelectron Spectroscopy) + SIMS ( Secondary Ion Mass Spectrometry) + Electrical Characterization ... Techniques + Atom Probe Tomography (APT) + Dual Beam Focused Ion Beam (FIB) + Scanning Electron Microscopy (SEM) + Transmission Electron Microscopy (TEM) Excellent… more
- Pacific Northwest National Laboratory (Richland, WA)
- …is seeking a qualified scientist to enhance our growing capability in dynamic secondary ion mass spectrometry (D-SIMS), specifically for the characterization ... of semiconductors materials. The incumbent would develop and perform appropriate measurements for materials characterization using a Cameca ims 7f-Auto. Expertise in depth profiling by D-SIMS is required, and knowledge of semiconductor device processing and… more
- Cummins Inc. (Columbus, IN)
- …(residual stress, retained austenite, phase analysis), gas chromatograph, ion chromatograph, inductively coupled plasma spectrometer, thermal gravimetric analyzer, ... differential scanning calorimeter, mass spectrometer, x-ray spectrometer, ultra sound analyzers, optical imaging equipment, tensile/compression testers, hardness… more