- The University of Texas at Arlington (Arlington, TX)
- …for advance packaging and interconnects. + Experience in Si-photonics integration. + Thin film characterization and analysis. + Experience with SEM, FIB, ... **Research Engineering Scientist Associate V** **Bookmark this Posting** **Print Preview**...focus on the reliability of packages; investigate and identify materials suitable for heterogenous integration, including but not limited… more
- Leonardo DRS, Inc. (Dallas, TX)
- …interpreting data from a scanning electron microscope, FTIR, ellipsometer, or other thin - film characterization and metrology tools and techniques + MATLAB, ... of Role** Leonardo DRS is looking for a confident, highly motivated Scientist with semiconductor processing, leadership, and project management experience to join… more
- Leonardo DRS, Inc. (Dallas, TX)
- …interpreting data from a scanning electron microscope, FTIR, ellipsometer, or other thin - film characterization and metrology tools and techniques. + MATLAB, ... Summary** Leonardo DRS is looking for a confident, highly motivated Scientist with semiconductor processing, leadership, and project management experience to join… more
- Micron Technology, Inc. (Boise, ID)
- …learning cycles by developing techniques to prepare and analyze semiconductor devices and thin film materials through atom probe tomography analysis. We ... the world to learn, communicate, and advance faster than ever. As a Surface Scientist Intern at Micron, you will learn about applying surface science techniques to… more
- Johns Hopkins University (Baltimore, MD)
- …and processing + Experience with XPS acquisition and processing + Experience with thin film and reciprocal mapping measurements + Knowledge of crystallography ... We are seeking an experienced X-ray scientist who will provide scientific support to the...scientist who will provide scientific support to the Materials Characterization Processing (MCP) Core Facility in the Department… more
- Argonne National Laboratory (Lemont, IL)
- …in-situ measurements (QCM, QMS, FTIR, ellipsometry, etc.) + Extensive experience in thin film characterization such as ellipsometry, XRD, XPS, RBS, XRR, ... The Applied Materials Division at Argonne National Laboratory is seeking...at Argonne National Laboratory is seeking a staff Assistant Scientist in the Functional Coatings Group. The successful applicant… more
- General Atomics and Affiliated Companies (San Diego, CA)
- …to support application development in manufacturing (including but not limited to thin and thick film coating), metrology, diagnostics, IFE subsystem design ... drawing on advanced scientific concepts. Executes research to understand materials characterization, develop new coating method and associated metrology techniques,… more